Precision motion control specialist Physik Instrumente (PI) provides new options for objective focusing stage applications. High-speed and high-resolution focusing is critical in wafer inspecting, ...
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Edwin Hauw and Tilmann Burckstummer discuss how automation and multimodal analysis are addressing long-standing limitations of optical pooled screening, enabling more scalable and informative CRISPR ...
A proof-of-concept quantum OCT system used single-exposure spectral detection to reach approximately 4 mm depth while ...
In this useful Tools & Resources article, the authors describe a new cryogenic light microscopy design and characterize its temperature and spatial stability. This compelling system avoids the ...
Comparing e-beam and optical inspection reveals their roles in semiconductor manufacturing, balancing high-resolution defect characterization and throughput.
Abstract: Aerosol satellite retrieval can provide detailed aerosol information on a large scale, which becomes one of the main ways of global aerosol research. However, rapid and accrue aerosol ...
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