Recent instrumental advances now enable large volumes of X-ray diffraction to be collected with high efficiency at synchrotron sources. This article shows that machine learning can produce an unbiased ...
8. Zewei Li, Wei Hu, Dajiang Lu, Cheng Liu, Yibin Tian, "Toroidal Adaptive Intensity and Spectrum Updating Image Reconstruction for Fourier Ptychographic Microscopy", 2025 IEEE International ...
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