When a good die fails test and gets scrapped, often no one notices, because false failures look identical to real ones. Yet across the industry, these phantom defects are quietly eroding yield, ...
Tech Xplore on MSN
Cutting-edge imaging and faster algorithms for finding minuscule defects in semiconductor chips
A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from ...
Live Science on MSN
'This moves the timeline forward significantly': Quantum computing breakthrough could slash pesky errors by up to 100 times
Researchers used a new technique called algorithmic fault tolerance (AFT) to cut the time and computational cost of quantum ...
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