X-ray diffraction methods lie at the foundation of materials science. Determination of the crystal structures of natural minerals and, later, of crystals grown in the laboratory led to our ...

Learn how to optimize cement particle size analysis using the Bettersizer 2600 Plus to achieve faster testing.

Semiconductor surfaces can generally be studied only with considerable experimental effort, for example, in an ultrahigh ...

The metrology and inspection landscape was dominated by optical tools such as optical microscopes and ellipsometers, using ...

Researchers at Paul Scherrer Institute (PSI) have developed the world's first achromatic lens for neutron imaging. The lens ...

What they saw was completely unexpected: not only was there a change in the thin film, but there was also a change in the ...

In the 1980s, math departments banned calculators, fearing arithmetic fluency would erode. In the 1990s, faculty banned ...

Summary: A research team reports the development of a high-resolution, adaptive light-sheet microscopy system capable of ...

Building material samples from the University of Delaware spent six months bolted to the outside of the International Space Station, exposed to vacuum, radiation and constant temperature swings. When ...

Discover how contamination analysis with FIB-FTIR enables rapid identification of microplastics and organic contaminants.

With PAT, pharmaceutical manufacturers achieve real-time process control, enhancing drug quality and accelerating the ...