Abstract: In this article, we introduce a new semi-analytical model to calculate the erase (ERS) transients of 3-D gate-all-around (GAA) NAND flash memories. A previously proposed program (PGM) model ...
Abstract: The BCH codes are widely used as Error Correcting Code (ECC) schemes for NAND Flash Memories. There have been strong demands to implement NAND Flash ...
You likely don’t know Drew Scanlon’s name, but odds are you’ve seen his face — especially if you’ve spent any time on social media over the past eight years. Maybe you thought the man behind the ...
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