Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...

A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...

image: THE INTRODUCTION OF DEFECTS INTO ELECTRODE MATERIALS FOR METAL-BASED BATTERIES IS AN EFFECTIVE STRATEGY TO IMPROVE BATTERY PERFORMANCE, DUE TO DEFECTIVE CATALYSTS HAVE THE ADVANTAGES OF HIGH ...

Scientists can now create and control tiny internal defects in ultra-thin materials, enabling new properties and potential breakthroughs in nanotechnology.

A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...

An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize ...

Materials scientists at the University of Minnesota Twin Cities have found a way to create and control tiny "flaws" inside ...

A study conducted by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences has demonstrated how nitrogen vacancies (V N) resolve ...

The spider robot increases speed and accuracy while accessing hard-to-reach areas.